Although nuclear magnetic resonance (NMR) measurement has emerged as one of the most widely utilized techniques for assessing the structure and molecular dynamics of materials, there remains untapped potential for the advancement of cost-effective micro-imaging methodologies specifically tailored for polymer thin films and electronic device components. Consequently, our endeavor revolves around the development of a novel imaging method for polymer thin film materials, employing a custom-built solid-state NMR apparatus. The fundamental objective of this research is to enhance the applicability of sample shape, streamline the measurement process, and achieve cost-effectiveness. To date, we have conducted ex-situ solid-state NMR imaging utilizing a static magnetic field gradient proximal to a planar neodymium magnet, resulting in successful depth imaging of multilayer polymer films. In this paper, we have refined the aforementioned technique and aimed to establish an imaging methodology for polymer thin film materials through ex-situ solid-state NMR, employing a needle-like ferromagnet capable of imparting localized magnetic field gradients surpassing those of the planar neodymium magnet. Initially, we conducted one-dimensional 19F magnetic resonance imaging (MRI) measurements in the depth direction of the sample, which yielded a blurred image. The sample under examination consisted of a three-layer film comprising poly(tetrafluoroethylene) [PTFE] (serving as the 19F source), an aluminum (Al) spacer, and additional PTFE layers. Furthermore, in our pursuit to elucidate the localized dynamics of the molecules, including difference in molecular motion between the surface and interior of the film, we endeavored to measure the T1 and T2 relaxation times of a PTFE single-film sample. In future, our objective is to extend this methodology to encompass two-dimensional (2D) and three-dimensional (3D) imaging, thereby elucidating the frequency-dependent nature of molecular motion.